Veeco MultiMode NanoScope IIIa SPM System
Research & Education Center “Advanced Nanomaterials and Nanotechnologies” (Siberian Federal University and Kirensky Institute of Physics)
Specification
The system is intended for investigations of surface topography and roughness, domain structure study, determination of size and height distributions of particles, measurements of magnetic characteristics, and spreading resistance microscopy.
The modular system involves
- atomic force microscope;
- scanning tunneling microscope;
- magnetic force microscope;
- spreading resistance microscope;
The system allows studying various materials on squares from 1 x 1 nm to 125 x 125 µm with resolutions from 1 nm (AFM) to atomic (STM).